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Scanning Microscopy 2010
Postek, M.T.; Newbury, D.E.; Platek, S.F.; Joy, D.C. (2010). Scanning Microscopy 2010. Proceedings of SPIE, the International Society for Optical Engineering, 7729. SPIE: Washington. ISBN 9780819482174.
Deel van: Proceedings of SPIE, the International Society for Optical Engineering. SPIE: Bellingham, WA. ISSN 0277-786X; e-ISSN 1996-756X, meer
Peer reviewed article  

Auteurs  Top 
  • Postek, M.T.
  • Newbury, D.E.
  • Platek, S.F.
  • Joy, D.C.

Inhoud
  • Groundwater, H.; Twardowski, M.S.; Dierssen, H.M.; Sciandre, A.; Freeman, S.A. (2010). A method for determining oceanic particle size distributions and particle composition using scanning electron microscopy coupled with energy dispersive spectroscopy, in: Postek, M.T. et al. Scanning Microscopy 2010. Proceedings of SPIE, the International Society for Optical Engineering, 7729: pp. 77290E. https://dx.doi.org/10.1117/12.853455, meer

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