Data PolicyPublications | Institutes | Persons | Datasets | Projects | Maps | Infrastructure [ report an error in this record ]basket (0): add | show Journal of Micro/Nanopatterning, Materials, and Metrology-JM3Journal of Micro/Nanopatterning, Materials, and Metrology-JM3. SPIE: Bellingham. ISSN 1932-5150; e-ISSN 2708-8340 All data in the Integrated Marine Information System (IMIS) is subject to the VLIZ privacy policy Top
