Assessment of homogeneity of candidate reference material at the nanogram level and investigation on representativeness of single particle analysis using electron probe X-ray microanalysis
Ro, C.-U.; Hoornaert, S.; Van Grieken, R. (1999). Assessment of homogeneity of candidate reference material at the nanogram level and investigation on representativeness of single particle analysis using electron probe X-ray microanalysis. Anal. Chim. Acta 389: 151-160
In: Analytica Chimica Acta. Elsevier: New York; Amsterdam. ISSN 0003-2670; e-ISSN 1873-4324, meer
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